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IEC 61032 Test Probe B

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IEC 61032 Test Probe B

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Brand Name :HeJin
Model Number :HT-I02
Certification :calibration certificate (cost additional)
Place of Origin :China
MOQ :1 set
Price :Negotiatable
Payment Terms :L/C, T/T
Supply Ability :30 sets / per month
Delivery Time :3 days
Packaging Details :Cartoon Box
Product name :Test Finger Probe B HT-I02
Usage :Access probes of IEC 60529 (IP code)
Probe code :B, Test Finger Probe
Description :Jointed test finger
Standard :IEC 61032, IEC 60529-1, IEC 60335-1
Material :Nylon handle + stainless steel finger
Finger length :80mm
Baffle diameter :Ф75mm
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IEC61032 Test Finger Probe Figure 2 Test Probe B 80mm Finger Length

Standard:

IEC 61032 ‘Protection of persons and equipment by enclosures – Probes for verification’ figure 2 test probe B.

IEC 60529 Degrees of protection provided by enclosures (IP Code) IP2X

IEC 60335-1 ‘Household and similar electrical appliances – Safety – Part 1: General requirements’

Application:

This probe is intended to verify the basic protection against access to hazardous parts. It is also used to verify the protection against access with a finger.

Access probes of IEC 60529 (IP code) to verify protection of persons against access to hazardous live parts or hazardous mechanical parts.

Feature:

It has two movable joints, which can be curved at 90°. Can be used with a electrical indicator.

A hole (M6) can be made at the end of the handle for connection with a push-pull gauge. The model with ‘T’ means that this model is with force.

Parameter:

Model HT-I02 HT-I02A HT-I02B HT-I02T
Name

Standard Test Finger

Test Finger Probe

Circular Baffle Test finger Large Baffle Test Finger Standard Test Finger With Force
Joint 1 30±0.2 30±0.2 30±0.2 30±0.2
Joint 2 60±0.2 60±0.2 60±0.2 60±0.2
Finger length 80±0.2 80±0.2 100±0.2 80±0.2
Fingertip to baffle 180±0.2 180±0.2 ---- 180±0.2
Cylindrical R2±0.05 R2±0.05 R2±0.05 R2±0.05
Spherical R4±0.05 R4±0.05 R4±0.05 R4±0.05
Fingertip cutting bevel angle 37o 0 -10′ 37o 0 -10′ 37o 0 -10′ 37o 0 -10′
Fingertip taper 14 o 0 -10′ 14 o 0 -10′ 14 o 0 -10′ 14 o 0 -10′
Test finger diameter Ф12 0 -0.05 Ф12 0 -0.05 Ф12 0 -0.05 Ф12 0 -0.05
A-A Section diameter Ф50 Ф50 ---- Ф50
A-A Section width 20±0.2 ---- ---- 20±0.2
Baffle diameter Ф75±0.2 Ф75±0.2 Ф125±0.2 Ф75±0.2
Baffle thickness 5±0.5 5±0.5 ---- 5±0.5
Force ---- ---- ---- With force 0-50N
Applied standard IEC61032-1 IEC60335-1 IEC60335-2-14 IEC60529-1

IEC 61032 Test Probe B IEC 61032 Test Probe B

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