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IP Test Equipment Access Probes For The Tests For Degrees Of Protection By IP1X To IP4X
Standard:
IEC 60529 Degrees of protection provided by enclosures (IP Code) IP1X, IP2X, IP3X, IP4X
Application:
It is used to indicate the degrees of protection provided by an enclosure against access to hazardous parts, ingress of solid foreign objects.
Parameter:
It is concluded to the following test probes according to the degree of protection provided by an enclosure is indicated by the IP Code:
| Model | HT-I01 |
| Name | Test probe A |
| Rigid test ball diameter (metal) | SФ50+0.05 0 |
| Baffle diameter (nylon) | Ф45±0.2 |
| Baffle thickness | 4 |
| Handle diameter | Ф10 |
| Handle length (nylon) | 100 |
| Force | ---- |
| Model | HT-I02 |
| Name | Standard Test Finger |
| Joint 1 | 30±0.2 |
| Joint 2 | 60±0.2 |
| Finger length | 80±0.2 |
| Fingertip to baffle | 180±0.2 |
| Cylindrical | R2±0.05 |
| Spherical | R4±0.05 |
| Fingertip cutting bevel angle | 37o 0 -10′ |
| Fingertip taper | 14 o 0 -10′ |
| Test finger diameter | Ф12 0 -0.05 |
| A-A Section diameter | Ф50 |
| A-A Section width | 20±0.2 |
| Baffle diameter | Ф75±0.2 |
| Baffle thickness | 5±0.5 |
| Force | ---- |
| Model | HT-I03 |
| Name | Test rod probe C |
| Probe diameter | Ф2.5+0.05 0 |
| Sphere diameter | SФ35±0.2 |
| Handle diameter | Ф10 |
| Probe length | 100±0.2 |
| Handle length | 100 |
| Force | ---- |
| Model | HT-I04 |
| Name | Test rod probe D |
| Diameter of the metal wire | Ф1+0.05 0 |
| Sphere diameter | SФ35±0.2 |
| Handle diameter | Ф10 |
| Probe length | 100±0.2 |
| Handle length | 100 |
| Force | ---- |